Extended X-ray Absorption Fine Structure (EXAFS)
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


Mean-square atomic displacement <u2> values can be experimentally obtained from various measurements, such as thermal expansion, thermal conductivity, extended x-ray absorption fine structure (EXAFS) and the widths of the x-ray or neutron diffraction peaks.




The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.