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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Assuming a number (n) of devices that fail in operation after successively longer times t1, t2, t3, t4, t5, ... tn. The mean time to failure (MTTF) is given by,
 ----------------------------- [2890a]
This time is different from the median time to failure (t50), also called MTTF.
The MTTF of a metal wire when subjected to electromigration (EM) effects is given by,
 ----------------------------- [2890b]
where,
A -- The cross-section area-dependent constant,
J -- The current density,
N -- The scaling factor, usually set to 2,
Ea -- The activation energy for electromigration,
k -- The Boltzmann constant,
T -- The temperature.
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