Misfit Strain - Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. | ||||||||
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When a film is deposited on a substrate, the misfit strain between the film and substrate can be given by, When the thickness of the film is increased, strain energy will build up. Therefore, the system needs to relax the accumulated strain. At a critical thickness, the relaxation process starts.
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. | ||||||||
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