Study of Electronic Structure by EXELFS
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


The EXELFS oscillations are very weak modulations of the EELS intensity and extend several hundred electron volts above the ELNES region. These oscillations are caused by ejected electrons with low kinetic energies behaving similarly to free electrons. The ejected electrons are backscattered by the surrounding atom shells, providing information on the coordination number and nearest neighbor distances. EXELFS, like EXAFS (extended X-ray absorption fine structure), is a unique technique for short range order (SRO) and atomic structure determination and offers the unique ability to obtain electronic structure at high spatial resolution.




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