Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Energy Filter Applied to Observation of Weak Reflections in Electron Diffractions

There is a contribution of inelastically scattered electrons to the conventional electron diffraction patterns (refer to thickness dependence and atomic number dependence) so that the Bragg spot intensity, especially of weak reflections, and the thermal-diffuse streaks caused by electron–phonon scattering can be enhanced by the zero-lossfiltering.