This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In order to avoid radiation damage caused by atom displacements in electron microscopes (EMs), the energy (accelerating voltage) of the incident electrons must be smaller than the threshold energy for knock-on processes, which lies in the range between 100 and 300 keV for most solid materials.