Electron Image Series Reconstruction with TEM
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


All the purpose of the methods of the electron image series reconstructions with TEM is to find an object wave function, ψo,s. The reconstruction methods can be basically categorized by two groups: i) weak phase object approximation (WPOA) and more generally ii) phase object approximation (POA). In principle, the methods based on the POA give a better estimation of the object wave function, but they don’t have closed form solutions and have to be computed iteratively and thus is very time consuming. [1] On the other hand, the reconstruction methods based on WPOA are fast but the TEM imaging requires much thinner samples.



[1] A. I. Kirkland and R. R. Meyer, Indirect high resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction, Microscopy and Microanalysis, vol. 10, pp. 401–413, 2004.




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