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Wavefunction Affected by Aberrations in CTEM
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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The lens aberrations affect the wavefunction in CTEM and thus affect the image formation. The wavefunction after the aberration consideration can be given by multiplying the electron wave in reciprocal space, ψ(k), by the phase factor dependent on the wave aberration function exp[iχ(k)]. The wavefunction at the image plane can be
written by,
 ----------------- [3747a]
where,
A(k) -- The circular function
Therefore, the image intensity, I(r), at the imaging plane can be given by,
 ------------------------ [3747b]
 ------------------------ [3747c]
The wavefunction at the back focal plane, ψ'(k) , can be given by,
 ------------------------ [3747d]
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