This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In practice, electron lenses cannot be made free from aberrations. The most severe aberrations are the spherical aberrations and the chromatic aberrations. There are additional aberrations which should be considered at higher spatial resolutions, e.g. more widely categorized by coherent and incoherent aberrations.