High-resolution in Electron Microscopes
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


In practice, electron lenses cannot be made free from aberrations. The most severe aberrations are the spherical aberrations and the chromatic aberrations. There are additional aberrations which should be considered at higher spatial resolutions, e.g. more widely categorized by coherent and incoherent aberrations.





The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.

Copyright (C) 2006 GlobalSino, All Rights Reserved