Zero-order Disk of CBED Patterns
- Practical Electron Microscopy and Database -
- An Online Book -  


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.



CBED (convergent beam electron diffraction) measurements need very high pixel resolution for recording the diffraction patterns. The camera length normally should be selected as high as possible to obtain a highly resolved pattern. In this case, the zero-order disk of the CBED patterns can almost cover the entire CCD camera.




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