Poor TEM Sample Quality Limiting Data Interpretation
- Practical Electron Microscopy and Database -
- An Online Book -



This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.



One critical limiting factor to quantitative analysis and data interpretations in TEM measurements is the occurrence of amorphous surface layers generated during the sample preparation [1].


[1] J.P. Chevalier, M.J. Hÿtch, Ultramicroscopy 52 (1994) 253.



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