This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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Stray radiation in EMs mainly originates from uncollimated electrons and characteristic and continuum x-rays. This stray radiation can hit the EM specimen especially when the specimen is thick, for instance, for TEM most effects are from the thicker regions in the outer parts of the specimens. Spurious x-rays of the samples can be generated from stray radiation, e.g. page4479. Fortunately, in modern EM systems, the stray aperture is used to protect the specimen from the impingement of x-rays.