Damping envelope in TEM
- Practical Electron Microscopy and Database -
- An Online Book -



This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.



Information limit depends on the damping envelope incorporating partial temporal coherence due to chromatic aberration, but not partial spatial coherence due to beam convergence.

Assuming the electron beam is a Gaussian-shaped source, a high-frequency damping function on TEM images can be approximately given by,

         High frequency damping function on TEM images -------------------- [4155]
         Δ -- The defocus spread due to a nonmonochromatic beam and electronic instabilities,
         λ -- The wavelength of the electron beam,
         k -- Spatial frequency,
         θc -- The beam convergence angle,
         Δf -- The defocus,          
         Cs -- Spherical aberration of the objective lens.



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