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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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The low spherical aberration of the objective lens gives a smaller point resolution as well as produces fewer oscillations of the contrast transfer function (CTF) beyond the point resolution. The accurate determination of the spherical aberration coefficient Cs is very important to many applications of EM techniques, such as electron holography [1,2], image processing and deconvolution [3], and electron crystallography of proteins [4].
1. Liehte, H., Parameters for high-resolution electron holography, Ultramicroscopy, 1993, 51, 15.
2. Peng, L.-M., Ren, G., Duan, X. F., Samplling theorem and digital electron microscopy, J. Chinese Electron Microscopy Society (in Chinese), 1996, 15(2-4), 117.
3. Li, F. H., Combination of high resolution electron microscopy and electron diffraction in crystal structure determination, J. Chin. Electr. Microsc. Soc., 1996, 1592-4, 143.
4. Baumeister, W., Typke, D., Electron Crystallography of Proteins, State of the Art and Strategies for the Future, MSA Bulletin, 1993, 23(1), 11.
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