Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
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Figure 4212 shows a cold trap is used in the specimen TEM chamber to prevent contamination of the TEM specimen on a FEI TEM system.
Figure 4212. Cold trap to prevent contamination of the TEM specimen.
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