Cold Trap to Prevent Contamination of TEM Specimen
- Practical Electron Microscopy and Database -
- An Online Book -  


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.



Figure 4212 shows a cold trap is used in the specimen TEM chamber to prevent contamination of the TEM specimen on a FEI TEM system.

Cold Traps

Figure 4212. Cold trap to prevent contamination of the TEM specimen.



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