Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
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A low accelerating voltage, e.g. 80 keV in TEM and 100 keV in STEM, can be used to minimize knock-on damage for some sensitive materials, e.g. graphene monolayer. In these microscopes, Cs (spherical aberration) corrector can be employed to increase their spatial resolution to, e.g. 1 Å.
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