Secondary Electron Detecting/Amplifying System in EMs
- Practical Electron Microscopy and Database -
- An Online Book -  


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. You can click How to Cite This Book to cite this book. Please let Dr. Liao know once you have cited this book so that the brief information of your publication can appear on the “Times Cited” page. This appearance can also help advertise your publication.



Figure 4223 shows an example of SEM systems. In all EMs (electron microscopes), detected information signal is amplified by a secondary electron detecting/amplifying system and then A/D-converted by an A/D converter.

Example of computer-controlled EMs: SEM system

Figure 4223. Example of computer-controlled EMs: SEM system.



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