Common Acronyms/Abbreviations used in Microscopy and Materials
- Practical Electron Microscopy and Database -
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Table 4302 lists the common acronyms (abbreviations) used in microscopy and other techniques, and materials. The electron microscopy (EM)-based acronyms have especially been labeled.

Table 4302. Common acronyms/abbreviations used in microscopy and other techniques, and materials.

Acronym
Full name
ADF*

Annular dark field
AES
 Auger electron spectroscopy
BEI*
 Backscattered electron imaging
BF TEM*
 Bright field TEM
CBED
 Convergent beam electron diffraction
CL
 Cathodoluminescence
Eenergy Dispersive X-ray Spectra
EELS*
 Electron energy-loss spectroscopy
ESEM*
 Environmental SEM
ETEM*
 Environmental TEM
FESEM*
 Fiel emission SEM
HAADF*
 High angle annular dark field
HREM*
 High resolution electron microscopy
HRTEM*
 High resolution transmission electron microscopy
HVEM*
 High voltage TEM
IVEM*

Intermediate voltage TEM
LAMMA
 Laser microprobe mass analysis
LEAP
 Local electrode atom probe
PIXE
 Proton-induced x-ray emission
PEM or PEEM
 Photoelectron microscopy
RBS
 Rutherford backscattering spectroscopy
SAED
 Selected-area electron diffraction
SEI*
 Secondary electron imaging
SEM*
 Scanning electron microscope
SIMS
 Secondary ion mass spectrometry
STEM*
 Scanning TEM
TEM*
 Transmission electron microscope
TEMT*

TEM tomography
UPS
 Ultraviolet photoelectron spectroscopy
VPSEM*
 Variable pressure SEM
XAS
 X-ray absorption spectroscopy
XES
 X-ray emission spectroscopy
XPS
 X-ray photoelectron spectroscopy
XRD
 X-ray diffraction
XRF
 X-ray fluorescence spectroscopy
* Electron microscopy (EM)-based acronyms.

 

 

 
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