Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Thin TEM Sample to Avoid Multiple/Plural Scattering

Most TEM specimens are so thick that plural scattering, such as elastic - inelastic, inelastic - inelastic, and elastic - elastic, is usually significant. The plural scattering is generally unwanted since it distorts the shape of the energy-loss spectrum. To avoid electron plural (multiple) scattering with matter, the TEM sample should be very thin (t ≤ λel ≤ λin). Here, λel and λin are mean free paths of elastic and inelastic scattering. For instance, a 4 nm thickness (t) of pure Ti film would not cause significant plural scattering.