Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| The charging effect during TEM observaiton leads to unacceptable microscope instabilities. To avoid charging effect, the TEM specimen can be coated with a thin carbon (C) layer.
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