EELS Analysis of Nanometer Sized Objects
- Practical Electron Microscopy and Database -
- An Online Book -  


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.



If the TEM sample is made of small particles, the particles can be dispersed in methanol and then drop and dry on a lacey C coated Cu TEM grid. EEL spectra can be obtained from the thin areas of the particles, typically <50 nm thick, overhanging holes in the lacy C film.

For EELS analysis of nanometer sized objects, contribution from the surface- and interface-related excitations may be predominant in their dielectric responses due to their large surface to volume ratio. [1] For instance, the individual nanotube can be studied by VEELS.

To obtain reliable structural data from the nano-structures (e.g. nanoparticles and nanotubes) through EELS measurements, any change in morphology must be negligible during the data acquisition. The electron beam can damage the nano-structures due to inelastic scattering in a number of ways:
         i) Surface sputtering/knock-on,
         ii) Bulk and surface diffusion,
         iii) Possible heating of thermally isolated metallic nanoparticles.


[1] Z. L. Wang, Micron 27, 265 (1996).



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