Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Temperature Rise in STEM Measurement

Even if the incident-beam current density in STEM imaging is higher than that in TEM imaging, the local temperature rise on the TEM specimen due to electron irradiation in STEM imaging would not be greater from that in TEM imaging because of the small beam size.