Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

TEM Observation of Carbon Nanotubes

Nodisplacement damage in carbon nanotubes is caused in TEM at imaging voltages of 100 kV or lower while displacement damage can be induced at 200 kV accelerating voltage or higher.