TEM Observation of Carbon Nanotubes
- Practical Electron Microscopy and Database -
- An Online Book -



This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. How to Cite This Book



No displacement damage in carbon nanotubes is caused in TEM at imaging voltages of 100 kV or lower while displacement damage can be induced at 200 kV accelerating voltage or higher.



The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission.

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