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Energy Stability of EELS
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Because of the long acquisition time for the 1-D (one dimensional) or 2-D (two dimensional) scanning of the probe, spectrum fluctuation may occur owing to accelerating voltage instability and the existence of a stray magnetic field in the spectrometer.
On the other hand, lower voltage TEMs have the advantage of achieving high energy stability for EELS.
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The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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