This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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Modern microscopes normally have very high beam current. However, artifacts can occur at this current density, especially when imaging or scanning on mobile elements. For instance, the standard deviation of signal in the atom intensity can be larger than expected from the counting statistics owing to atom motion between successive scan lines causing distortion of imaging or recording spectra in some spot profiles.