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Removal of Sample Thickness Variations in STEM Data Analysis
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. How to Cite This Book
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Thickness variations along the wedge have been subtracted using a second-order polynomial fit.
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The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission.
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