Characteristic X-Rays and Critical Ionization
Energies of Some Elements

Practical Electron Microscopy and Database
- An Online Book -

https://www.globalsino.com/



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

1 2   3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18
1   2
H   He
3 4   5 6 7 8 9 10
Li Be   B C N O F Ne
11 12   13 14 15 16 17 18
Na Mg   Al Si P S Cl Ar
19 20   21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36
K Ca   Sc Ti V Cr Mn Fe Co Ni Cu Zn Ga Ge As Se Br Kr
37 38   39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54
Rb Sr   Y Zr Nb Mo Tc Ru Rh Pd Ag Cd In Sn Sb Te I Xe
55 56   71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86
Cs Ba {57-70} Lu Hf Ta W Re Os Ir Pt Au Hg Tl Pb Bi Po At Rn
87 88 103 104 105 106 107 108 109 110 111 112 114
Fr Ra [89-102] Lr Rf Db Sg Bh Hs Mt Ds Uuu Uub   Uuq
 
57 58 59 60 61 62 63 64 65 66 67 68 69 70    
{lanthanides} {57-70} La Ce Pr Nd Pm Sm Eu Gd Tb Dy Ho Er Th Yb    
89 90 91 92 93 94 95 96 97 98 99 100 101 102
{actinides} [89-102] Ac Th Pa U Np Pu Am Cm Bk Cf Es Fm Md No    
 
 
 

The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.