Practical Electron Microscopy and Database

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Investigation and Quantification of Elemental Segregation at Interface

Up to date, there are three major techniques used to investigate and quantify the elemental segregation at interfaces, which are energy dispersive X-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS), and the atom probe field ion microscopy (APFIM). Note that APFIM method is very limited to metallic and metal-ceramic interfaces.