This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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Up to date, there are three major techniques used to investigate and quantify the elemental segregation at interfaces, which are energy dispersive X-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS), and the atom probe field ion microscopy (APFIM). Note that APFIM method is very limited to metallic and metal-ceramic interfaces.