Hard X-Rays
- Practical Electron Microscopy and Database -
- An Online Book -

https://www.globalsino.com/EM/



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Figure 4641 shows the escape depths of various species generated by high-energy electrons penetrating into a solid. Auger electrons and "soft" X-rays are emitted in depth of <1 nm and in diameter of beam size, secondary electrons are emitted in depth of < 10 nm and in diameter of beam size, and the emission depths and diameters of backscattered electrons and "hard" X-rays depend on both the beam energy and beam size.

Escape depths of various species generated by high-energy electrons penetrating into a solid

Figure 4641. Escape depths of various species generated by high-energy electrons penetrating into a solid.

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.