Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Operando Microscopy Techniques

Operando microscopy techniques refer to methods used to observe and analyze materials or devices in real-time under actual operating conditions. These techniques are particularly valuable in fields such as materials science, catalysis, battery research, and semiconductor technology, where understanding the behavior of materials during operation is crucial for improving performance and durability.

Key characteristics of operando microscopy are:

  • Real-Time Observation: Operando techniques allow researchers to monitor changes in the material's structure, composition, and properties while it is functioning, providing insights into how the material behaves in its working environment.
  • Simultaneous Measurement: In addition to imaging, operando techniques often involve simultaneous measurement of other properties, such as electrical, chemical, or mechanical, to correlate the observed structural changes with functional performance.
  • Environmental Control: These techniques typically require specialized equipment to simulate operating conditions, such as temperature, pressure, electrical bias, or chemical environment, within the microscope.
  • Applications:
    • Catalysis: Observing how catalysts change during a reaction to optimize their efficiency and durability.
    • Battery Research: Monitoring the structural changes in battery materials during charging and discharging cycles to improve battery life and safety.
    • Semiconductor Devices: Studying the behavior of materials in electronic devices under electrical bias to enhance device reliability and performance.
Example Techniques:
  • Operando Transmission Electron Microscopy (TEM): Allows for high-resolution imaging of materials at the atomic scale while they are subjected to conditions such as heating, electrical biasing, or gas exposure.
  • Operando Scanning Electron Microscopy (SEM): Provides surface imaging and analysis of materials under operating conditions, often coupled with techniques like Energy-Dispersive X-ray Spectroscopy (EDS) for elemental analysis.
  • Operando X-ray Spectroscopy: Used to study changes in chemical states and local environments of atoms in materials during operation.