Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
For any crystalline material, visibility criterion with g·b analysis can be used for dislocation characterization. For instance, to determine whether the threading edge dislocation with a Burgers vector of a/2[1-10] in Si (silicon crystals) can be visible under specific diffraction conditions, we'll use the g·b criterion. This criterion states that a dislocation is visible in a TEM image when the dot product of the diffraction vector g and the Burgers vector b is non-zero (g·b ≠ 0). This can be done by calculating g·b for each of the given vectors:
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