Practical Electron Microscopy and Database

In anisotropic materials, the directional dependence of their physical properties—known as anisotropy—significantly influences the results obtained from Electron Energy Loss Spectroscopy (EELS). This inherent anisotropy can have a significant impact on EELS measurements, particularly on the intensity of the signals detected. [1]

For instance, in anisotropic materials, the EELS intensity can vary significantly depending on the orientation of the material relative to the incident electron beam. This variation occurs because the material's electronic properties—and therefore the interaction with the electron beam—change with direction.

Understanding the impact of anisotropy on EELS intensity is important for accurately interpreting data obtained from EELS experiments on anisotropic materials. When conducting such experiments, researchers must consider how the material's orientation affects the detected energy loss to ensure precise characterization of the material’s electronic structure and composition. This understanding is essential for advancing the analysis of anisotropic materials and improving the reliability of conclusions drawn from EELS data.

[1] Konrad Jarausch, Paul Thomas, Donovan N. Leonard, Ray Twesten, Christopher R. Booth, Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography, Ultramicroscopy 109 (2009) 326–337.