This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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The contrasts of SEM images can be basically categorized by topographic, material, and voltage contrast. The material contrast, also called atomic number (Z-) contrast, originate from the difference of SE or BSE yields of the chemical elements in the specimen. The spatial resolution of SE mode normally is higher than that of BSE.