Contrast Dependence on Specimen Composition/Elements of Materials in SEM
- Practical Electron Microscopy and Database -
- An Online Book -  


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.



The contrasts of SEM images can be basically categorized by topographic, material, and voltage contrast. The material contrast, also called atomic number (Z-) contrast, originate from the difference of SE or BSE yields of the chemical elements in the specimen. The spatial resolution of SE mode normally is higher than that of BSE.





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