Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Contrast Dependence on Angle of Detection in SEM

The initial SE (secondary electrons) angular-distribution as SEs leave the emitting surface is predicted to follow a cosine distribution [1]
                       SE (secondary electrons) angular-distribution ----------------------------------------------- [4838]
Here, δ0 is the SE yield at α = 0°. Figure 4838 shows the SE angular-distribution for our polycrystalline gold sample at electron beam energy of 1.5 keV.

SE (secondary electrons) angular-distribution

Figure 4838. SE angle-resolved yield data for polycrystalline Au with electron beam energy of 1.5 keV.
The curve fits the data using the cosine distribution of Equation [4838]. [2]

 

 

 

[1] J. H. L. Jonker, The angular-distribution of the secondary electrons of nickel, Philips Res. Rep., 6, 372-387,1951.
[2] N. Nickles, R. E. Davies and J. R. Dennison, Applications of Secondary Electron Energy- and Angular-Distributions to Spacecraft Charging, 6th Spacecraft Charging Technology Conference, AFRL-VS-TR-20001578, 1 September 2000.