Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
| In a variable pressure, gaseous environment, and low vacuum electron microscopes (SEM and TEM), the beam distortions can be reduced or eliminated by introducing a gas into the specimen chamber [1–4].
[1] V.N.E. Robinson, J. Phys. E 8 (1975) 638.
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