Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Troubleshooting of EELS/GIF Measurement on Thin TEM/STEM Specimen

The spectrometer background originates mainly from backscattering of the zero-loss beam from a beam-trap aperture located in front of the detector, resulting in most noticeable with very thin TEM/STEM specimens.