Chapter/Index: Introduction | A |
B |
C |
D |
E |
F |
G |
H |
I |
J |
K |
L |
M |
N |
O |
P |
Q |
R |
S |
T |
U |
V |
W |
X |
Y |
Z |
Appendix
Pulsed Electron Beam in Electron Microscopy
| Table 692 lists some common examples of generations and applications of pulsed electron beams in electron microscopy.
Table 692. Generations and applications of pulsed electron beams in electron microscopy.
| EM |
Pulse Width |
Interval between Two Pulses / Frequency |
Pulse Mechanism |
Application |
Reference |
| TEM |
2 ps or 14 ps |
12.5 ns / 80 MHz |
RF-cavity chopped-beam (see page677) |
Mitigate specimen radiation damage |
[1] |
| 2 ps or 14 ps |
(152 ps or 165 ps) / ~6 GHz |
| TEM |
300 fs |
100 μs / 10 kHz |
Pulsed electron beam generation based on laser-based photoelectron emission (see page2637) |
Time-resolved studies of dynamic processes at the atomic and molecular levels. |
[1] |
| 5 μs / 200 kHz |
| <100 fs / 10 THz |
[2] |
| EM |
ns to µs |
|
Electrostatic beam deflection (beam blanking) (see page2464) |
|
|
| EM |
ns |
|
Field emission with modulated voltage (see page704) |
|
|
| Electron beam lithography and EM |
10 ps to 100 ns |
|
Microwave and pulsed RF-based guns (see page510) |
|
|
[1] David J. Flannigan, Elisah J. VandenBussche, Pulsed-beam transmission electron microscopy and radiation damage, Micron, 172, 103501, 2023.
[2] Vladimir A. Lobastov, Ramesh Srinivasan, and Ahmed H. Zewail, Four-dimensional ultrafast electron microscopy, 102 (20) 7069-7073, 2005.
|
