Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
Glossary of TermsSEM (Scanning Electron Microscope)An electron microscope that scans a focused beam of electrons across a sample's surface to create an image. TEM (Transmission Electron Microscope)A microscopy technique where a beam of electrons is transmitted through an ultra-thin specimen, interacting with the sample as it passes through. EELS (Electron Energy Loss Spectroscopy)A technique that measures the change in energy of electrons as they pass through a material, providing information about the electronic structure, bonding, and elemental composition of the sample. EDS (Energy-Dispersive X-ray Spectroscopy)An analytical technique used for the elemental analysis or chemical characterization of a sample. STEM (Scanning Transmission Electron Microscope)A type of TEM where the electron beam is focused into a narrow spot that is scanned over the sample in a raster pattern. FIB (Focused Ion Beam)A technique used particularly in the semiconductor industry for site-specific analysis, deposition, and ablation of materials. AFM (Atomic Force Microscopy)A type of scanning probe microscopy with a very high resolution, used to measure the force between a sharp probe and the sample surface.
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