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Exampes of machine learning applications in electron microscopy, with and without physical models, are:
          i) Denoising images for electron tomography. [1]
          ii) Advanced data analytics, which refers to methods used for big data handling, inference, prediction and decision making. [2]
          iii) Pattern recognition and classification. [4-11]

Results from machine learning can help reduce physical modelling variables. [3]

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Count how many empty strings in a list. Code:
         
       Output:    
         

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[1] Staniewicz, L. & Midgley, P. A. Machine learning as a tool for classifying electron tomographic reconstructions. Adv. Struct. Chem. Imag. 1, 9 (2015).
[2] Sze, V., Chen, Y. H., Yang, T. J. & Emer, J. S. Efcient processing of deep neural networks: a tutorial and survey. Proc. IEEE 105, 2295 – 2329 (2017).
[3] N. G. Orji, M. Badaroglu, B. M. Barnes, C. Beitia, B. D. Bunday, U. Celano, R. J. Kline, M. Neisser, Y. Obeng and A. E. Vladar, Metrology for the next generation of semiconductor devices, Nature Electronics, 1, 532, 2018.
[4] G. Loy, A. Zelinsky, IEEE Transactions on Pattern Recognition and Machine Intelligence 25 (8) (August 2003) 959.
[5] G. Marola, IEEE Transactions on Pattern Recognition and Machine Intelligence 11 (1) (January 1989) 104.
[6] H. Zabrodsky, S. Peleg, D. Avnir, IEEE Transactions on Pattern Analysis and Machine Intelligence 17 (12) (December 1995) 1154.
[7] R.T.C.M. Park, K. Brocklehurst, Y. Liu, IEEE Transactions on Pattern Analysis and Machine Intelligence 31 (10) (OCTOBER 2009) 1804.
[8] D. Shen, H. Ip, K. Cheung, E. Teoh, IEEE Transactions on Pattern Analysis and Machine Intelligence 21 (1999) 466.
[9] K. Simonyan and A. Zisserman, “Very deep convolutional networks for large-scale image recognition,” 2014, arXiv:1409.1556. Available: https://arxiv.org/abs/1409.1556.
[10] J. van de Weijer, L.J. van Vliet, P.W. Verbeek, R. van Ginkel, Curvature estimation in oriented patterns using curvilinear models applied to gradient vector fields, IEEE Transactions on Pattern Analysis and Machine Intelligence 23 (9) (2001) 1035–1042.
[11] P.W. Verbeek, L.J. van Vliet, On the location error of curved edges in low-pass filtered 2-D and 3-D images, IEEE Transactions on Pattern Analysis and Machine Intelligence 16 (7) (1994) 726–733.