Machine Learning Example Step-by-Step (Wafer Fail Analysis)

Machine Learning Example Step-by-Step (Wafer Fail Analysis)
- Python for Integrated Circuits -
- An Online Book -

Python for Integrated Circuits http://www.globalsino.com/ICs/

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

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Table 4035. Selections of algorithm for wafer analysis.

Algorithm	Functions/Reasons
LASSO	If using linear regression, then LASSO (Least Absolute Shrinkage and Selection Operator) can be selected
PCA or cluster	Can be used to reduce the dimension if some features are correlated.

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Detecting Anomalies in Wafer Manufacture: code:
           Print even numbers

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           Print even numbers
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Code (remove outlier for feature_1 and feature_3):

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           Print even numbers

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           Print even numbers

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           Print even numbers

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           Print even numbers

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