Electron microscopy
 
Properties of Silicon
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Table 4785. Properties of silicon.

Properties
0 K 300 k
Atoms (cm-3)
  5.02 x 1022
Atomic weight
28.09
Density (gm/cm3)
  2.329
Crystal Structure
  Diamond
Lattice constant (nm)
  0.5431
Band gap (eV)
1.17 1.121
Bandgap of Si
Melting point (K)
1685
Specific heat (J/g°C)
0.7
Dissociation Pressure (Atm)
   
Thermal expansion coefficient
(10-6 °C-1)
  2.33-2.59
Thermal conductivity (W/cmK)
  1.31
Direct band gap (eV)
   
Indirect band gap (eV)
  1.12
Breakdown field (V/cm)
  ~3 x 105
Dielectric constant
  11.9
Electron affinity qχ (eV)
  4.03
Electron mobility (cm2/V-s)
  1350-1500
Hole mobility (cm2/V-s)
  450
Minority carrier lifetime (µs): Electrons (p-type)
  800
Minority carrier lifetime (µs): Holes (n-type)
  1000
εs0
   
Intrinsic carrier concentration (cm-3)
  9.65 x 109
Intrinsic resistivity (Ωcm)
  3.3 x 105
Effective density of states in conduction band (cm-3)
  2.86 x 1019
Effective density of states in valence band (cm-3)
  2.66 x 1019
Density of states electron effective mass
  1.08 m0
Effective mass of electron (mh/m0)
  0.26
Longitudinal electron effective mass
  0.98
Transverse electron effective mass
  0.19
Effective mass of hole (mh/m0)
  0.19
Heavy hole effective mass
  0.49 m0
Light hole effective mass
  0.16 m0
Density of states hole effective mass
  0.55 m0
Transport hole effective mass
  0.37 m0
Optical phonon energy (eV)
  0.063
Index of refraction
  3.42

 

 

 

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