Electron microscopy
 
Bitline in 3D NAND
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Figure 1991a shows the schematic diagram of 3D NAND flash memory array with multi-layer bitline and string select line connections:

  • SSL (String Select Line):
    • Island-gate SSL: Indicates the string select line that connects different layers of the memory cells.
    • Multiple SSLs (SSL0, SSL1, ..., SSL7) are shown, corresponding to different layers and connections within the memory array.
  • ML1: For SSL local interconnect.
    • Indicates a local interconnect for string select lines, possibly for signal routing within a local section of the memory array.
  • 64-WL (Word Line):
    • Shows that 64 word lines are connected to the WL decoder, controlling the gates of the memory cells.
    • The word lines are repeated in the X direction for various units, indicating a large array of memory cells.
  • GSL (Ground Select Line):
    • Connected to the source line (poly trench) at the bottom.
    • Used to select the ground connection for the memory strings during operations.

3D NAND

Figure 1991a. Schematic diagram of 3D NAND flash memory array with multi-layer bitline and string select line connections. [1]

3D NAND

Figure 1991b. Schematic diagram of 3D NAND flash memory array. [1]

3D NAND

Figure 1991c. 3D NAND flash memory array. [2]

Figures 1991d shows cross-section view and equivalent circuit diagram of 3D NAND flash array structure.

CSL

Figures 1991d. .(a) Cross-section view and (b) equivalent circuit diagram of 3D NAND flash array structure. [3]

 

 

 

 

 

 

 

[1] Kuo-Pin Chang, H. Lue, etc., Memory Architecture of 3D Vertical Gate (3DVG) NAND Flash Using Plural Island-Gate SSL Decoding Method and Study of it's Program Inhibit Characteristics, 4th IEEE International Memory… 20 May 2012, Computer Science Engineering, 2012 4th IEEE International Memory Workshop, DOI:10.1109/IMW.2012.6213641Corpus.
[2] https://www.eetimes.com/first-look-at-samsungs-48l-3d-v-nand-flash/2/.
[3] Geun Ho Lee, Sungmin Hwang, Junsu Yu and Hyungjin Kim, Architecture and Process Integration Overview of 3D NAND Flash Technologies, Appl. Sci. 2021, 11, 6703. https://doi.org/10.3390/app11156703.

 

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