Dynamic analysis by laser stimulation (DALS) is a method to analyze device operation conditions by means of laser radiation. In this technique, a device is stimulated with a 1.3 μm laser while operating it with test patterns by LSI tester. And then, device operation status (pass/fail) changes due to heat generated by the laser. Therefore, the pass/fail signal change is expressed as an image that indicates the point causing timing delay, marginal defect, etc.

Figure 4920. Dynamic analysis by laser stimulation (DALS). [1]

[1] Overview of function of iPHEMOS series.