About Me

Hello! I am Yougui Liao, an expert in electron microscopy with extensive experience in semiconductor and solid oxide fuel cell (SOFC) technology. My work has largely focused on the application of advanced electron microscopy techniques for the analysis and characterization of semiconductor materials and devices, and SOFC. I am also a dedicated author, contributing to the body of knowledge in this specialized field.

Professional Experience

I have spent 30 years mastering the intricacies of electron microscopy, applying it to a wide range of semiconductor- and SOFC-related research and development. My professional journey includes key roles where I have led the charge in utilizing electron microscopy to gain deep insights into the materials and processes used in semiconductor and SOFC manufacturing.

  • Electron Microscopy Specialist - Focused on the use of electron microscopy for failure analysis and material characterization in semiconductor devices and SOFC.
  • Failure Analysis
  • Automation, Machine Learning and Data Integration with Python
  • Data analysis with JMP
  • Author and Researcher - Published a comprehensive online book on semiconductor technologies, with a special focus on electron microscopy techniques.

Education

My educational background is firmly rooted in the principles of electron microscopy and its applications in semiconductor technology. I have pursued in-depth studies in the following areas:

  • Electron Microscopy Techniques
  • Electron Optics
  • Diffraction Techniques
  • Detector Systems (CCD cameras and detectors)
  • Simulation for TEM images and diffraction patterns
  • Material Characterization
  • Semiconductor Physics
  • Foundations of Analog and Digital Electronic Circuits
  • Integrated Circuit Design, Fabrication, and Test

Publications

I am the author of a widely-referenced online book (Practical Electron Microscopy and Database), with additional contributions in the fields of automation and machine learning (link). This publication serves as a valuable resource for professionals and researchers, particularly those interested in the advanced applications of electron microscopy.

  • Invited Speaker: Review of Practical Problem Solving for Advanced Semiconductor Industry (2023 Microscopy & MicroAnalysis).
  • Statistical CD Measurements Based on Analytical TEM Techniques and DM Scripting and its Application on PFA Analysis of IC Devices.
  • TEMautoReporting—Automation of Elemental Analysis and TEM Reporting with Graphical User Interface.
  • First order correction of EELS measurements based on experimental ADF imaging, 2022, IEEE 19th Annual WMED, DOI: 10.1109/WMED55302.2022.9758034, 2022.
  • Automated classification of Powerpoint reports and recommendation of failure modes using text-based machine learning algorithm.
  • Automated algorithm of die filter for PFA sampling.

Example of public services: ISTFA Session Chair of the AI Applications for Failure Analysis.

Contact Me

If you would like to have any discussion and inquiries, please feel free to reach out to me via email.