半导体专业名司缩写表

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B billion; boron
Ba barium
BARC bottom antireflective coating
BASE Boston Area Semiconductor Education (Council)
BAW bulk acoustic wave
BC bias contrast
BDEV behavior-level deviation
BDS Brownian Dynamics Simulation
Be beryllium
BEOL back end of line
BESOI bonded and etchback silicon on insulator
BF brightfield
BFGS Broyden-Fletcher- Goldfarb-Shanno optimization algorithm
BFL buffered field-effect transistor logic
BGA ball grid array
BHT Brinell hardness test
Bi bismuth
BiCMOS bipolar complementary metal-oxide semiconductor
BIFET bipolar field-effect transistor
BIM binary intensity mask
BiMOS bipolar metal-oxide semiconductor
BIST built-in self-test
BIT bulk ion temperature
BITE built-in test equipment
BMC bubble memory controller
BMD bulk micro defect
BOE buffered oxide etchant
BOR bottom of range
BOSS Book of SEMI Standards; binary object storage system
BOX buried oxide
BPR beam profile reflectometry; business process reengineering
BPSG boron phosphosilicate glass
BPTEOS BPSG from a TEOS source
Br bromine
BSE backscattered electron detection
BTAB bumped tape automated bonding
BV breakdown voltage
C carbon
Ca calcium
CA CIM architecture
CAA CIM applications architecture
CAB Competitive Analysis Benchmarking
CAD computer-aided design
CADT control application development tool
CAE computer-aided engineering
CAI computer-assisted instruction
CAM computer-aided manufacturing
CAPS computer-assisted problem solving
CAR chemically amplified resist
CARRI Computerized Assessment of Relative Risk Impacts
CASE computer-aided softwareengineering; computer-aided systems engineering
CAT computer-aided testing
CAW Construction Analysis Workgroup
CAWC cryogenic aerosol wafer cleaning
CBGA ceramic ball grid array
CBS chemical bottle storage area
CBT computer-based training
CC chip carrier; cluster controller
CCC ceramic chip carrier
CCD charge-coupled device
CCSL compatible current-sinking logic
CCW counterclockwise
Cd cadmium
CD critical dimension
CD/OL critical dimension overlay
CDA clean dry air
CDE chemical downstream etch
CDEM Customer Delivery Enterprise Model
CDI collector-diffusion isolation
CDM Common Device Model for SAB
CDO controlled decomposition/oxidation
CDR chemical distribution room
CDS chemical distribution system
Ce cerium
CE capillary electrophoresis
CEC cell evaluation chip
CEE control execution environment
CEM continuous emissions monitoring
CER-DIP ceramic dual in-line package
CFA component failure analysis
CFC chlorofluorocarbon
CFD computational fluid dynamics
CFM contamination-free manufacturing
CIC cleanroom interface chamber
CID charge-injection device
CIE computer-integrated engineering
CIM computer-integrated manufacturing
CIM-OSA computer-integrated manufacturing-open systems architecture (ESPRIT program)
CIP Continuous Improvement Program
CIS Center for Integrated Systems
CISC complex instruction set computer
Cl chlorine
CLCC ceramic leaded chip carrier
CLIC closed-loop intensity control
CM configuration management; cassette module
CMC cassette module controller
CML current mode logic
CMM capability maturity model
CMOS complementary metal-oxide semiconductor
CMP chemical mechanical planarization
CMR common-mode rejection ratio; cancel move request
CNC computer numerical control; condensation nucleus counter
CNT carbon nanotube
Co cobalt
COB chip-on-board
COC cost of consumables
CODEC coder-decoder
COED computer-optimized experimental design
COGS cost of goods sold
CoO cost of ownership
CORBA common object request broker architecture
CORE composite object reference
COSS common object services specification
COT customer-owned tooling
CoV coefficient of variance
Cp process capability
CPD concurrent product development
CPE Communications
CPGA ceramic pin grid array
Cpk process capability index
CQFP ceramic quad flat pack
CQN closed-queuing network
Cr chromium
CRC cyclic redundancy check
CRM Cost/Resource Model
Cs cesium
CSA CIM systems architecture
CSE control systems engineering
CSF critical success factor
CSL current-steering logic
CSMA/CD carrier-sense
CSP chip-scale package
CSPED concurrent semiconductor production and equipment development
CST CIM systems technology
CSTR continuously stirred tank reactor
CSV comma-separated variable
CTC cluster tool controller
CTE coefficient of thermal expansion
CTI cycle time improvement
CTMC cluster tool modular communications
Cu copper
CUB central utility building
CUBES capacity utilization bottleneck efficiency system
CUI common user interface
CUSUM cumulative sum
CV capacitance-to-voltage
CVCM collected volatile condensable materials
CVD chemical vapor deposition
CW continuous wave
Cz Czochralski process

 

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