Throughput Limiting Factors in TEM Observations - Practical Electron Microscopy and Database - - An Online Book - |
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Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
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Specimen throughput in TEM observation is mainly limited by the time involved in switching the electromagnetic lenses. Such lens transitions are required when images are recorded at different magnifications, with different accelerating voltages of the electron beam, or in different imaging modes. The transition consists of the following procedure: In practice, control strategies are used to decrease both the maximum transition error (1-5% of the full range) and the maximum transition time (~0.5 s) involved in the switch of the electromagnetic lenses.
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