Practical Electron Microscopy and Database - An Online Book
Table of Contents/Index 
Second Edition: Practical Electron Microscopy and Database, Yougui Liao (2007)
Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
Chapter Introduction
Electron microscopes (EMs) and ion microscopes History of electron microscopies (EMs)
Advanced/latest transmission electron microscopes (TEMs) History of TEM
Computer-control on electron microscopes Schematic diagram of SEM systems
Success of EM experiments Schematic diagram of TEM systems
Ion beams and their applications History of EELS technique
Techniques for material characterizations and their capabilitiess Relationship between diffraction group and point group
  Chapter A Chapter B     Chapter C Chapter D
  Chapter E Chapter F   Chapter G Chapter H
  Chapter I Chapter J   Chapter K Chapter L
  Chapter M   Chapter N     Chapter O   Chapter P  
  Chapter Q   Chapter R     Chapter S   Chapter T  
  Chapter U   Chapter V     Chapter W   Chapter X  
  Chapter Y|   Chapter Z     Chapter Appendix