Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Table of Contents/Index

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

R-centered lattices/R-centering & its space groups  
Trigonal
R3 (146) R-3 (148)
R32 (155) R3m (160)
R3c (161) R-3m (166)
R-3c (167)  
 
R-planes of sapphire crystal  
 Radiation damage in EMs  
Generating a pulsed electron beam using an RF-cavity chopped-beam in EMs Generating a pulsed electron beam using microwave and pulsed RF-based guns in EMs
EELS detection limited by radiation damage Effect of electron dose on radiation damage
Electron radiation damage depending on energy deposited in specimen Electrostatic charging in EMs
Heat generation/temperature increase by electron irradiation Effect of electron beam diameter on radiation damage
Electron dose inducing material damage in bulk and at sample surface Inelastic collision (knock-on)
Ionization damage (radiolysis) by electrons Displacement of atoms due to electron irradiation in EMs
Sputtering & its yield of materials in electron microscopes Hydrocarbon (HC) contamination of EM specimens
 
Radial: Azimuthal and radial circles/Ronchigram in STEM Radial distribution function (RDF) from electron diffraction patterns
Radiolytic process (radiolysis) induced by electron irradiation  
Radiative stopping power
Radio
Radius of path of electrons/charged particles in a magnetic field Radius of HOLZ rings
Radius ratio rule/limiting radius ratio Radon transform
Random access memories Raman spectra
Random distribution of atom positions
Effect of random distribution of atom positions on diffractograms  
Range of energy losses of various EELS signals  
Rare earth 
Misfit layer chalcogenides: (AX)1+δ(BX2)n (A =ˆ rare earth/Sn/Pb/Sb/Bi; B =ˆ Ti/V/Cr/Nb/Ta; X =ˆ S/Se)  
 Rare gas solids
EELS of rare gas solids  
Ratio techniques
Ratio technique for elemental quantification by EDS Ratio of EDS peak intensities of two elements
Ratio of EDS peaks of the same elements M4/M5 ratio of EELS white lines
Determination of elemental ratio using EELS Ratio of the L3 to L2 white-line intensity for 3d/4d elements
 
Rate of energy loss of incident electrons RC time delays in ICs
Redeposition of sputtered atoms in FIB Redistribution and redistribution rate of SEs
Reduced glass transition temperature Refinement: Crystallographic structure refinement
Reflection/Reflectivity
Film thickness determination by X-ray reflectivity/interference Reflection electron energy loss spectroscopy (REELS)
Reflection electron detecting/amplifying system  
 Refraction
Refraction effect of secondary electrons Refractive index
Refraction index of electron lenses  
Reinstallation of Gatan DM on PC connected with TEM system Relaxation of atoms excited by incident electrons  
Relrod – a thin film diffraction effect in TEM  
Relaxation
Structural relaxation of metallic glasses at elevated temperatures Elastic relaxation due to TEM-specimen thinning
Reliability and long-term failure in ICs
Thermal stress for test of reliability and long-term failure in ICs  
 
Reliability/reproducibility of EDS data & EDS system Remanent polarization in ferroelectrics
Remote/computer application in EMs Removal of atoms due to electron irradiation in EMs
Removal of scan noise in STEM data analysis Removal of sample thickness variations in STEM data analysis
Rewritable
Rewritable phase-change optical memory disks Rewritable digital versatile disks
 
Ray aberration Rayleigh criterion
Real lens in EMs  
Real space and reciprocal space
Electron wavefunction in image plane in real space and reciprocal space Reciprocal space vector
Real space and reciprocal space in EMs Diffraction intensity distribution in reciprocal lattices
Reciprocal lattice spacings Real crystal spacings/d-spacings & d-Ratio
Brillouin zone Wigner-Seitz cell
Conversion between reciprocal space vector and angle  
 
Rechargeable lithium ion batteries  
Reconstruction
Reconstructing a three-dimensional (3D) image from 2D images in STEM tomography  
Electron image series reconstruction with TEM Weak phase object methods in image series reconstruction with TEM
Parabaloid method for image series reconstruction with TEM Wiener filter method for image series reconstruction with TEM
Iterative wave function reconstruction for image series reconstruction with TEM Reconstruction of off-axis holograms
Rectangle (box) annotation on Gatan DigitalMicrograph Rectangle ROI on Gatan DigitalMicrograph
Rectangular symmetry in electron diffraction patterns Resin 
Resistive contact with resistive interface  
Bipolar resistive switching in perovskite insulators  
Resistivity/resistance (Electrical)
Table of electrical resistivity/conductivity of materials  
Electrical resistivity/resistance of metallic glass depending on temperature Polysilicon and diffused resistors
Temperature coefficient of resistance (TCR) Electrical resistivity of materials studied by EELS
Resolving power/resolution of microscopes and spectrometers 
External disturbances on resolution of EMs Spatial resolution limits  
 
Retention & retention loss in ferroelectrics  
Responding time of secondary electron emission after electron irradiation Retractable TV-rate camera
Rhenium
Rhenium Trioxide (ReO3) Interaction of incident electrons with rhenium element
Rhodium (Rh)
EELS measurement of rhodium (Rh)  
 
Rhombic Penrose tiling  
 Rhombohedral crystal systems
Trigonal & rhombohedral space groups  
Relationship between the hexagonal and primitive rhombohedral unit cells Examples of indexed electron diffraction patterns of rhombohedral crystals
 
Richardson-Lucy deconvolution Rippling effect in FIB-EM sample preparation
Right-hand rule
Right-hand rule of Lorentz force vector   Right-hand rule for cross products
 
Rochelle salt/Seignette salt (NaKC4H4O6•4H2O) Rock salt/Halite
Rocking-curve intensity oscillations within CBED Rocking point/pivot point/tilt & shift and their purities in TEM
 Ronchigram/shadow image/microdiffraction pattern in STEM
Ronchigram comparison between Cs-corrected and uncorrected STEM conditions Coherence of electron beam/interference pattern in STEM/Ronchigram
Aberration coefficients reflected in Ronchigram   Ronchigram at Gaussian/Scherzer focus
Ronchigram depending on accelerating voltage of electron beam Ronchigrams of amorphous films
STEM alignment with Ronchigram Defocus/overfocus/underfocus in Ronchigrams
Ronchigrams of crystalline films in STEM Spherical aberration rings in Ronchigram
Aberration determination by focal sets of Ronchigram Segmental Ronchigram autocorrelation function matrix (SRAM) for aberration correction
Electron Ronchigram contrast transfer function (CTF) in STEM Aberration coefficient C1,2/A1: two-fold axial astigmatism and its corrections in TEMs 
Correction of 3rd order star aberration (S3) Axial coma (B2) correction with Ronchigram
 
Room/environment/installation of EM systems Rotary vacuum pumps
Round magnetic lens
Differences between round and multipole lenses  
Rotation
Image rotation in EMs Rotationally symmetrical electron lenses/magnetic field
Image helical rotation and inversion when changing magnification or focusing  Rotation method for three dimensional (3D) electron diffraction recording
Types of electron tomography rotation/tilt schemes  Rotation axis (1, 2, 3, 4 and 6 (Cn)) in crystallography
Five-fold axis Four-fold axis
Six-fold axis Three-fold axis
Two-fold axis  
 
Rotoinversion axis in crystallography Roughing pumps
Line Width Roughness (LWR) and LER (Line Edge Roughness) in CD (Critical Dimension) Measurements    
Ruthenium (Ru)
EELS measurement of ruthenium (Ru)  
 Rutherford (elastic) scattering
Rutherford cross-section Rutherford (elastic) scattering and HAADF 
Rutherford’s nuclear model Model of beam broadening based on Rutherford scattering theory

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