Reliability and long-term failure in ICs

Reliability and Long-term Failure in ICs
- Practical Electron Microscopy and Database -
- An Online Book -

https://www.globalsino.com/EM/

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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IC reliability highly depends on their stability under electrical and thermal stresses because of their high temperature sensitivity in comparison with metallic materials.

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.