Rate of Energy Loss of Incident Electrons
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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The rate of energy loss of incident electrons is dependent on the property of the target material known as the ‘stopping power’.

 

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The book author (Dr Y. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr Y. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.



 
 
 
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